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Nikon DART Semiconductor Wafer Inspection Software

Overview

Advanced, cost-effective wafer inspection and review software.

DART Software is an integrated software package that can fully automate the inspection process. It allows users to recall, review and classify defects based upon an integrated graphical map. Ideal for use with Nikon Optistation and NWL wafer loader systems, DART automatically controls all routine functions, including programming and point-to-point/die-to-die inspection.

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Categories: Software

Applications: Wafers

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